Silansys has extensive expertise in all areas of chip and module development and can work with customers through the many phases of bringing a product from concept to volume product. We have significant expertise in :
Design Phase: Testability and Yield requirements
Embedded BIST, IDDQ, Scan & Functional Test
Lab Characterization
Production Test Development support
Yield Optimization
Debug (including EBEAM and FIB expertise)
Firmware Stub, System and Interoperability Testing